GOMEZ, F. R. Improvement on Leakage Current Performance of Semiconductor IC Packages by Eliminating ESD Events. Asian Journal of Engineering and Technology, [S. l.], v. 6, n. 5, 2018. DOI: 10.24203/ajet.v6i5.5464. Disponível em: https://www.ajouronline.com/index.php/AJET/article/view/5464. Acesso em: 27 oct. 2021.