Diaz, Luis, Ohio University, United States

• Asian Journal of Applied Sciences Vol. 2 No. 5 (2014): October 2014 - Articles
  Photo-electronic Measurement of Film Thickness for the Sulphonation of Methyl Esters in Falling Film Reactors
  Abstract  PDF  Optical-electronic measurement of film thickness for the sulphonation of methyl esters in falling film reactors